PIXE-measurement of Kα X-ray production cross sections for 1-MeV C<sup>+</sup>-ions in thick samples of Si, Fe, Cu and Zn
© 2018 Elsevier B.V. Particle-Induced X-ray Emission (PIXE) using heavy ions proved to be an alternative with respect to PIXE using light protons due to relatively large cross sections. In this work we explored the capabilities of PIXE with using singly-charged carbon ions at relatively low energy o...
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| Main Authors: | , , |
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| Format: | Journal |
| Published: |
2019
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| Subjects: | |
| Online Access: | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85060303065&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/63758 |
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| Institution: | Chiang Mai University |