Control chart pattern classification using Fourier descriptors and neural networks
This paper presents the method of Fourier descriptors and neural networks developed for control chart pattern analysis. The pattern analysis is important to achieve appropriate control and to produce high quality products. This paper also investigates the use of features extracted from Fourier descr...
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Main Authors: | , |
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Format: | Conference or Workshop Item |
Published: |
2018
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Online Access: | https://repository.li.mahidol.ac.th/handle/123456789/11651 |
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Institution: | Mahidol University |