Control chart pattern classification using Fourier descriptors and neural networks

This paper presents the method of Fourier descriptors and neural networks developed for control chart pattern analysis. The pattern analysis is important to achieve appropriate control and to produce high quality products. This paper also investigates the use of features extracted from Fourier descr...

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Bibliographic Details
Main Authors: Pisit Phokharatkul, Supachai Phaiboon
Other Authors: Mahidol University
Format: Conference or Workshop Item
Published: 2018
Subjects:
Online Access:https://repository.li.mahidol.ac.th/handle/123456789/11651
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Institution: Mahidol University

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