Author Search Results

1

On the "switching defects" in the SiON and high-k gate dielectrics subjected to bias-temperature stressing

On the "switching defects" in the SiON and high-k gate dielectrics subjected to bias-temperature stressing

by Boo, Ann Ann
Published 2015

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Theses and Dissertations

2

PMOSFET NBTI (negative-bias temperature instability) measurement using ultra-fast switching method

PMOSFET NBTI (negative-bias temperature instability) measurement using ultra-fast switching method

by Boo, Ann Ann.
Published 2009

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Final Year Project

3

New observations on the correlation between hole-trapping transformation and SILC generation under NBTI stressing

New observations on the correlation between hole-trapping transformation and SILC generation under NBTI stressing

by Boo, Ann Ann, Tung, Zhi Yan, Ang, Diing Shenp
Published 2018

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