Author Search Results

1

Whole field curvature and residual stress determination of silicon wafers by reflectometry

Whole field curvature and residual stress determination of silicon wafers by reflectometry

by Ng, Chi Seng, Asundi, Anand Krishna
Published 2017

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Conference or Workshop Item

2

Rapid defect detections of bonded wafer using near infrared polariscope

Rapid defect detections of bonded wafer using near infrared polariscope

by Asundi, Anand Krishna, Ng, Chi Seng
Published 2017

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Conference or Workshop Item

3

Fast full-field out-of-plane deformation measurement using fringe reflectometry

Fast full-field out-of-plane deformation measurement using fringe reflectometry

by Huang, Lei, Ng, Chi Seng, Asundi, Anand Krishna
Published 2013

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