Fast full-field out-of-plane deformation measurement using fringe reflectometry
Full-field out-of-plane deformation measurement of specular surfaces can be implemented quickly and conveniently using fringe reflectometry. The system configuration is simple and processing is fast. With the assistance of an advanced fringe pattern processing technique, the windowed Fourier ridges...
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| Main Authors: | , , |
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| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
2013
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| Online Access: | https://hdl.handle.net/10356/101337 http://hdl.handle.net/10220/13700 |
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| Institution: | Nanyang Technological University |
| Language: | English |