Neutral electron trap generation and hole trapping in thin oxides under electrostatic discharge stress

by Chim, W.K., Teh, G.L.
Published 2014

Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides

by Teh, G.L., Chim, W.K.
Published 2014

Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line technique

by Teh, G.L., Chim, W.K., Swee, Y.K., Co, Y.K.
Published 2014