The versatility of logit over probit regression analyses estimating the strength of gear teeth

by Shariff, A.A., Zaharim, A.
Published 2008

The effects of high temperature storage on lead free solder joint material strength using pull test method

by Harif, M.N., Ahmad, I., Zaharim, A.
Published 2017

Employability skills for an entry-level engineer as seen by Malaysian employers

by Yuzainee M.Y., Zaharim A., Omar M.Z.
Published 2023

Impact of different dose and angle in HALO structure for 45nm NMOS device

by Salehuddin, F., Ahmad, I., Hamid, F.A., Zaharim, A.
Published 2017

Optimization of process parameter variability in 45 nm PMOS device using Taguchi method

by Salehuddin, F., Ahmad, I., Hamid, F.A., Zaharim, A.
Published 2017

Influence of HALO and source/drain implantation on threshold voltage in 45nm PMOS device

by Salehuddin, F., Ahmad, I., Hamid, F.A., Zaharim, A.
Published 2017

Effect of process parameter variations on threshold voltage in 45nm NMOS device

by Salehuddin, F., Ahmad, I., Hamid, F.A., Zaharim, A.
Published 2017

Impact of HALO structure on threshold voltage and leakage current in 45nm NMOS device

by Salehuddin, F., Ahmad, I., Hamid, F.A., Zaharim, A.
Published 2017

Analyze and optimize the silicide thickness in 45nm CMOS technology using Taguchi method

by Salehuddin, F., Ahmad, I., Hamid, F.A., Zaharim, A.
Published 2017

Effect of moisture on underfill interfacial adhesion and packages flexural strength in flip chip packaging

by Endut, Z., Ahmad, I., Zaharim, A., Sukemi, N.M.
Published 2017

Characterization and optimizations of silicide thickness in 45nm pMOS device

by Salehuddin, F., Ahmad, I., Hamid, F.A., Zaharim, A.
Published 2017

Optimization of process parameter variability in 45 nm PMOS device using Taguchi method

by Salehuddin F., Ahmad I., Hamid F.A., Zaharim A.
Published 2023

Impact of different dose and angle in HALO structure for 45nm NMOS device

by Salehuddin F., Ahmad I., Hamid F.A., Zaharim A.
Published 2023

Impact of HALO structure on threshold voltage and leakage current in 45nm NMOS device

by Salehuddin F., Ahmad I., Hamid F.A., Zaharim A.
Published 2023

Analyze and optimize the silicide thickness in 45nm CMOS technology using Taguchi method

by Salehuddin F., Ahmad I., Hamid F.A., Zaharim A.
Published 2023

Characterization and optimizations of silicide thickness in 45nm pMOS device

by Salehuddin F., Ahmad I., Hamid F.A., Zaharim A.
Published 2023

Effect of process parameter variations on threshold voltage in 45nm NMOS device

by Salehuddin F., Ahmad I., Hamid F.A., Zaharim A.
Published 2023

Influence of HALO and source/drain implantation on threshold voltage in 45nm PMOS device

by Salehuddin F., Ahmad I., Hamid F.A., Zaharim A.
Published 2023

Performances test statistics for single outlier detection in bilinear (1,1,1,1) models

by Zaharim, A., Mohamed, I., Ahmad, I., Abdullah, S., Omar, M.Z.
Published 2017

Employment preference for university of fresh engineering graduates

by Yuzainee M.Y., Rahmat R.A.O.K., Zaharim A.
Published 2023