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C-V Meter find applications in structures and properties of semiconductor devices research. A C-V system Meter has been developed and used for characterizing diodes. The system provide a quasi-static measurement method and uses feed back charge method for making capacitance measurements. The develop...
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| Main Author: | |
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| Format: | Theses |
| Language: | Indonesia |
| Online Access: | https://digilib.itb.ac.id/gdl/view/7343 |
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| Institution: | Institut Teknologi Bandung |
| Language: | Indonesia |
| Summary: | C-V Meter find applications in structures and properties of semiconductor devices research. A C-V system Meter has been developed and used for characterizing diodes. The system provide a quasi-static measurement method and uses feed back charge method for making capacitance measurements. The development of C-V Meter system involving the design of a voltage source, a step source and a capacitance meter. The system consists of a MCS-51 based SoC, a capacitance meter with a feedback charge amplifier, absolute circuit, and a 14 bits Analog to Digital Converter (ADC), and a voltage source with an 8 bits current Digital to Analog Converter (IDAC), a voltage step source, amplifiers and a current limiter. The system designed to measure and displaying C-V measurement result on a Dekstop Computer via an RS-232 serial communication port. C-V Meter system calibrated for each parts and tested for measuring C-V characteristic of capasitors and diodes. |
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