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C-V Meter find applications in structures and properties of semiconductor devices research. A C-V system Meter has been developed and used for characterizing diodes. The system provide a quasi-static measurement method and uses feed back charge method for making capacitance measurements. The develop...
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Main Author: | SUHENDI (20205016), ASEP |
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Format: | Theses |
Language: | Indonesia |
Online Access: | https://digilib.itb.ac.id/gdl/view/7343 |
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Institution: | Institut Teknologi Bandung |
Language: | Indonesia |
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