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C-V Meter find applications in structures and properties of semiconductor devices research. A C-V system Meter has been developed and used for characterizing diodes. The system provide a quasi-static measurement method and uses feed back charge method for making capacitance measurements. The develop...

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Bibliographic Details
Main Author: SUHENDI (20205016), ASEP
Format: Theses
Language:Indonesia
Online Access:https://digilib.itb.ac.id/gdl/view/7343
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Institution: Institut Teknologi Bandung
Language: Indonesia
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