ENHANCEMENT OF MARKOV RANDOM FIELD MECHANISM TO ACHIEVE FAULT-TOLERANCE IN NANOSCALE CIRCUIT DESIGN

As the MOSFET dimensions scale down towards nanoscale level, the reliability of circuits based on these devices decreases. Hence, designing reliable systems using these nano-devices is becoming challenging. Therefore, a mechanism has to be devised that can make the nanoscale systems perform relia...

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Bibliographic Details
Main Author: ANWER, JAHANZEB ANWER
Format: Thesis
Language:English
Published: 2011
Online Access:http://utpedia.utp.edu.my/2862/1/Masters_Thesis-_Jahanzeb_Anwer.pdf
http://utpedia.utp.edu.my/2862/
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Institution: Universiti Teknologi Petronas
Language: English
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