Four point probe geometry modified correction factor for determining resistivity

Four point probe geometry modified correction factor for determining resistivity

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Bibliographic Details
Main Authors: Algahtani, Fahid, Thulasiram, Karthikram B., Nashrul Fazli, Mohd Nasir, Dr., Holland, Anthony Stephen
Other Authors: s3276519@student.rmit.edu.au
Format: Article
Language:English
Published: The International Society for Optical Engineering (SPIE) 2014
Subjects:
Resistivity
Sheet resistance
Test structure
Online Access:http://dspace.unimap.edu.my:80/dspace/handle/123456789/34701
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Institution: Universiti Malaysia Perlis
Language: English
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