Four point probe geometry modified correction factor for determining resistivity

Link to publisher's homepage at http://spiedigitallibrary.org/

Saved in:

Bibliographic Details
Main Authors:	Algahtani, Fahid, Thulasiram, Karthikram B., Nashrul Fazli, Mohd Nasir, Dr., Holland, Anthony Stephen
Other Authors:	s3276519@student.rmit.edu.au
Format:	Article
Language:	English
Published:	The International Society for Optical Engineering (SPIE) 2014
Subjects:	Resistivity Sheet resistance Test structure
Online Access:	http://dspace.unimap.edu.my:80/dspace/handle/123456789/34701
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	Universiti Malaysia Perlis
Language:	English

Be the first to leave a comment!

Similar Items