Characterization of semiconductor nanowires using optical tweezers

Characterization of semiconductor nanowires using optical tweezers

We report on the optical trapping characteristics of InP nanowires with dimensions of 30 (±6) nm in diameter and 2 - 15 μm in length. We describe a method for calibrating the absolute position of individual nanowires relative to the trapping center using synchronous high-speed position sensing and a...

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Bibliographic Details
Main Authors: Reece, Peter J., Toe, Wen Jun, Wang, Fan, Paiman, Suriati, Gao, Qiang, Tan, Hark Hoe, Jagadish, Chennupati
Format: Article
Language:English
Published: American Chemical Society 2011
Online Access:http://psasir.upm.edu.my/id/eprint/24834/1/Characterization%20of%20semiconductor%20nanowires%20using%20optical%20tweezers.pdf
http://psasir.upm.edu.my/id/eprint/24834/
http://pubs.acs.org/doi/abs/10.1021/nl200720m
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Institution: Universiti Putra Malaysia
Language: English

Internet

http://psasir.upm.edu.my/id/eprint/24834/1/Characterization%20of%20semiconductor%20nanowires%20using%20optical%20tweezers.pdf
http://psasir.upm.edu.my/id/eprint/24834/
http://pubs.acs.org/doi/abs/10.1021/nl200720m

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