Characterization of semiconductor nanowires using optical tweezers

• Main Authors: Reece, Peter J., Toe, Wen Jun, Wang, Fan, Paiman, Suriati, Gao, Qiang, Tan, Hark Hoe, Jagadish, Chennupati
• Format: Article
• Language: English
• Published: American Chemical Society 2011
• Online Access: http://psasir.upm.edu.my/id/eprint/24834/1/Characterization%20of%20semiconductor%20nanowires%20using%20optical%20tweezers.pdf; http://psasir.upm.edu.my/id/eprint/24834/; http://pubs.acs.org/doi/abs/10.1021/nl200720m
• Institution: Universiti Putra Malaysia

We report on the optical trapping characteristics of InP nanowires with dimensions of 30 (±6) nm in diameter and 2 - 15 μm in length. We describe a method for calibrating the absolute position of individual nanowires relative to the trapping center using synchronous high-speed position sensing and a...