Investigating The Effects Of Lead Forming Parameters On Intermetallic Layer Crack Using The Finite-Element Method

The lead trim-and-form process is important in the manufacturing of programmable logic devices, microprocessors, and memories. Normally, inspection of a chip package is performed in a lead inspection machine after the lead forming process to detect defects on the leads. One such defect is the lead i...

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Bibliographic Details
Main Authors: Kok, Chee Kuang, J.W.C. Chin, M.M. Rajmohan, V.S.H. Yeo, Said, Md Radzai
Format: Article
Language:English
Published: springer 2012
Online Access:http://eprints.utem.edu.my/id/eprint/4147/1/ck.kok-10.1007_s11664-012-1918-8.pdf
http://eprints.utem.edu.my/id/eprint/4147/
https://link.springer.com/article/10.1007/s11664-012-1918-8
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Institution: Universiti Teknikal Malaysia Melaka
Language: English
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