Numerical analysis of carrier statistics in low-dimensional nanostructure devices

• Main Authors: Saad, Ismail, Taghi Ahmadi, M., Riyadi, Munawar A., Ismail, Razali, Arora, Vijay K.
• Format: Article
• Language: English; English
• Published: Penerbit UTM Press 2009
• Subjects: T Technology (General); TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utm.my/id/eprint/21029/3/IsmailSaad2009_NumericalAnalysisofCarrierStatistics.pdf; http://eprints.utm.my/id/eprint/21029/4/jurnalteknologi/article/view/170; http://eprints.utm.my/id/eprint/21029/
• Institution: Universiti Teknologi Malaysia

The carrier statistics for low-dimensional nanostructure is elaborated. The density of state (DOS) is proportional to d D ? where d is the dimensionality of the nanostructure and D ? is the De- Broglie wavelength proportion of Fermi-Dirac (FD) integral that covers the carrier statistics to all degen...