A Chemically Amplified Fullerene-Derivative Molecular Electron-Beam Resist

Current lithographic resists depend on large polymeric materials, which are starting to limit further improvements in line-width roughness and feature size. Fullerene molecular resists use much smaller molecules to avoid this problem. However, such resists have poor radiation sensitivity. Chemical a...

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Bibliographic Details
Main Authors: Gibbons, Francis, Mohd Zaid, Hasnah, Robinson, A.P.G.
Format: Article
Published: 2007
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Online Access:http://eprints.utp.edu.my/886/1/Small_2007.PDF
http://eprints.utp.edu.my/886/
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Institution: Universiti Teknologi Petronas

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