A Chemically Amplified Fullerene-Derivative Molecular Electron-Beam Resist
Current lithographic resists depend on large polymeric materials, which are starting to limit further improvements in line-width roughness and feature size. Fullerene molecular resists use much smaller molecules to avoid this problem. However, such resists have poor radiation sensitivity. Chemical a...
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Main Authors: | , , |
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Format: | Article |
Published: |
2007
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Subjects: | |
Online Access: | http://eprints.utp.edu.my/886/1/Small_2007.PDF http://eprints.utp.edu.my/886/ |
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Institution: | Universiti Teknologi Petronas |