Monte Carlo simulations and DSP application for optical parameter measurement
The Texas Instrument TMS320VC55I0 DSK's calculation abilitiy with different program languages is investigated for minimum the DSP's measurement time. The steps of Monte Carlo simulations embedded into the DSK's flash through the DSK's JTAG interface for optical parameters meas...
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| Main Authors: | , , |
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| 格式: | Article |
| 語言: | English |
| 出版: |
H. : ĐHQGHN
2017
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| 主題: | |
| 在線閱讀: | http://repository.vnu.edu.vn/handle/VNU_123/56676 |
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