Survey of WO3 thin film structure built on ITO/glass substrates by the Raman and XRD spectroscopies
Tungsten oxide film was deposited on ITO-coated glass by using RF magnetron sputtering method from WO3 ceramic target. Thin film preparation – process took place in Ar + O2 plasma. The dependence of tungsten oxide film structure on experiment conditions was investigated by X-ray diffraction (XRD) Ra...
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oai:112.137.131.14:VNU_123-568122018-07-13T09:17:58Z Survey of WO3 thin film structure built on ITO/glass substrates by the Raman and XRD spectroscopies Le, Van Ngoc Tran, Cao Vinh Le, Quang Toai Nguyen, Duc Thinh Huynh, Thanh Dat WO3 structure WO3 /ITO/glass Raman spectroscopy Tungsten oxide film was deposited on ITO-coated glass by using RF magnetron sputtering method from WO3 ceramic target. Thin film preparation – process took place in Ar + O2 plasma. The dependence of tungsten oxide film structure on experiment conditions was investigated by X-ray diffraction (XRD) Raman spectroscopy. In this paper, we considered that the thickness of ITO layers about 150nm to 350nm clearly effects on the Raman and XRD spectrograms of WO3 films. 2017-08-14T08:38:08Z 2017-08-14T08:38:08Z 2009 Article Le, V. N, et al. (2009). Survey of WO3 thin film structure built on ITO/glass substrates by the Raman and XRD spectroscopies. VNU Jounial of Science , Mathematics- Physics, 25, 47-55. 2588-1124 http://repository.vnu.edu.vn/handle/VNU_123/56812 en application/pdf H. : ĐHQGHN |
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WO3 structure WO3 /ITO/glass Raman spectroscopy |
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WO3 structure WO3 /ITO/glass Raman spectroscopy Le, Van Ngoc Tran, Cao Vinh Le, Quang Toai Nguyen, Duc Thinh Huynh, Thanh Dat Survey of WO3 thin film structure built on ITO/glass substrates by the Raman and XRD spectroscopies |
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Tungsten oxide film was deposited on ITO-coated glass by using RF magnetron sputtering method from WO3 ceramic target. Thin film preparation – process took place in Ar + O2 plasma. The dependence of tungsten oxide film structure on experiment conditions was investigated by X-ray diffraction (XRD) Raman spectroscopy. In this paper, we considered that the thickness of ITO layers about 150nm to 350nm clearly effects on the Raman and XRD spectrograms of WO3 films. |
format |
Article |
author |
Le, Van Ngoc Tran, Cao Vinh Le, Quang Toai Nguyen, Duc Thinh Huynh, Thanh Dat |
author_facet |
Le, Van Ngoc Tran, Cao Vinh Le, Quang Toai Nguyen, Duc Thinh Huynh, Thanh Dat |
author_sort |
Le, Van Ngoc |
title |
Survey of WO3 thin film structure built on ITO/glass substrates by the Raman and XRD spectroscopies |
title_short |
Survey of WO3 thin film structure built on ITO/glass substrates by the Raman and XRD spectroscopies |
title_full |
Survey of WO3 thin film structure built on ITO/glass substrates by the Raman and XRD spectroscopies |
title_fullStr |
Survey of WO3 thin film structure built on ITO/glass substrates by the Raman and XRD spectroscopies |
title_full_unstemmed |
Survey of WO3 thin film structure built on ITO/glass substrates by the Raman and XRD spectroscopies |
title_sort |
survey of wo3 thin film structure built on ito/glass substrates by the raman and xrd spectroscopies |
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H. : ĐHQGHN |
publishDate |
2017 |
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http://repository.vnu.edu.vn/handle/VNU_123/56812 |
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1680964096842792960 |