Investigation of zinc oxide thin film by spectroscopic ellipsometry

• المؤلفون الرئيسيون: Nguyen, Nam Dinh, Tran, Quang Trung, Le, Khac Binh, Nguyen, Dang Khoa, Vo, Thi Mai Thuan
• التنسيق: مقال
• اللغة: English
• منشور في: H. : ĐHQGHN 2017
• الموضوعات: Thin film; ellipsometry; transmission spectrum; refraction index; extinction coefficient
• الوصول للمادة أونلاين: http://repository.vnu.edu.vn/handle/VNU_123/57409
• المؤسسة: Vietnam National University, Hanoi

ZnO films were deposited on glass substrates by magnetron R F-sputtering. An accurate determ ination of the optical constants of these films is extremely important prior to its application in optical devices and spectroscopic ellipsometry provides a reasonably accurate method for the determination o...