A maximum likelihood method for detecting bad samples from Illumina BeadChips data

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Bibliographic Details
Main Author: Nguyễn, Hà Anh Tuấn
Format: Theses and Dissertations
Language:other
Published: Đại học Quốc gia Hà Nội 2016
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Online Access:http://repository.vnu.edu.vn/handle/VNU_123/8273
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Institution: Vietnam National University, Hanoi
Language: other
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