A maximum likelihood method for detecting bad samples from Illumina BeadChips data

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Main Author: Nguyễn, Hà Anh Tuấn
Format: Theses and Dissertations
Language:other
Published: Đại học Quốc gia Hà Nội 2016
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Online Access:http://repository.vnu.edu.vn/handle/VNU_123/8273
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Institution: Vietnam National University, Hanoi
Language: other
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spelling oai:112.137.131.14:VNU_123-82732020-04-19T13:02:45Z A maximum likelihood method for detecting bad samples from Illumina BeadChips data Nguyễn, Hà Anh Tuấn Công nghệ thông tin Dữ liệu 2016-04-13T07:37:26Z 2016-04-13T07:37:26Z 2012 Thesis 3 tr. http://repository.vnu.edu.vn/handle/VNU_123/8273 other application/pdf application/pdf Đại học Quốc gia Hà Nội
institution Vietnam National University, Hanoi
building VNU Library & Information Center
country Vietnam
collection VNU Digital Repository
language other
topic Công nghệ thông tin
Dữ liệu
spellingShingle Công nghệ thông tin
Dữ liệu
Nguyễn, Hà Anh Tuấn
A maximum likelihood method for detecting bad samples from Illumina BeadChips data
format Theses and Dissertations
author Nguyễn, Hà Anh Tuấn
author_facet Nguyễn, Hà Anh Tuấn
author_sort Nguyễn, Hà Anh Tuấn
title A maximum likelihood method for detecting bad samples from Illumina BeadChips data
title_short A maximum likelihood method for detecting bad samples from Illumina BeadChips data
title_full A maximum likelihood method for detecting bad samples from Illumina BeadChips data
title_fullStr A maximum likelihood method for detecting bad samples from Illumina BeadChips data
title_full_unstemmed A maximum likelihood method for detecting bad samples from Illumina BeadChips data
title_sort maximum likelihood method for detecting bad samples from illumina beadchips data
publisher Đại học Quốc gia Hà Nội
publishDate 2016
url http://repository.vnu.edu.vn/handle/VNU_123/8273
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