Programmable IC tester

• Main Authors: Ang, Benny L., Go, Edgar S., Ng, Darwin T., Yeung, Kwong Kai W.
• Format: text
• Language: English
• Published: Animo Repository 1993
• Subjects: Electronic digital computers > Programming; Programmable array logic; Digital integrated circuits; Computer design; Electric testing
• Online Access: https://animorepository.dlsu.edu.ph/etd_bachelors/16374
• Institution: De La Salle University

The modern world is becoming increasingly dependent on electronic systems, and on digital systems such as computers in particular. New applications for computers are found everyday, and demands for more powerful and faster computers to support such applications continue. ICs compose the digital computers prevalent in the market. ICs are referred to as the soul of a digital computer. To be effective, digital systems must work correctly and, when they fail, techniques must be available to detect the presence of a failure and locate its cause. IC testers provide time savings and increased confidence when building and debugging digital electronic system. The objective of this thesis is to make a prototype of an IC tester that would be able to detect defective ICs as well as determining their DC characteristics. The study also aims to provide the Computer Technology students with a tool that would help them in their laboratory experiments. The tester was built and tested in a modular manner. The hardware was assembled and tested thoroughly before the software was tested on the system. This approach enabled the proponents to pinpoint the causes of errors and malfunctions more easily. With the use of an IC tester, it gives the students and the people in the field of electronics a more practical way in debugging a microcomputer system. Their primary objective in using the IC tester is to determine which IC is defective therefore it allows the designers to have confidence with their hardware designs.