Programmable IC tester

• Main Authors: Ang, Benny L., Go, Edgar S., Ng, Darwin T., Yeung, Kwong Kai W.
• Format: text
• Language: English
• Published: Animo Repository 1993
• Subjects: Electronic digital computers > Programming; Programmable array logic; Digital integrated circuits; Computer design; Electric testing
• Online Access: https://animorepository.dlsu.edu.ph/etd_bachelors/16374
• Institution: De La Salle University

The modern world is becoming increasingly dependent on electronic systems, and on digital systems such as computers in particular. New applications for computers are found everyday, and demands for more powerful and faster computers to support such applications continue. ICs compose the digital comp...