Electrical characterization and resolution of device failures on 90 nanometer phase change memory technology of numonyx
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oai:animorepository.dlsu.edu.ph:etd_masteral-107342024-03-14T01:37:41Z Electrical characterization and resolution of device failures on 90 nanometer phase change memory technology of numonyx Quiray, Josselsor Faustino 2010-01-01T08:00:00Z text https://animorepository.dlsu.edu.ph/etd_masteral/3896 Master's Theses English Animo Repository |
| institution |
De La Salle University |
| building |
De La Salle University Library |
| continent |
Asia |
| country |
Philippines Philippines |
| content_provider |
De La Salle University Library |
| collection |
DLSU Institutional Repository |
| language |
English |
| format |
text |
| author |
Quiray, Josselsor Faustino |
| spellingShingle |
Quiray, Josselsor Faustino Electrical characterization and resolution of device failures on 90 nanometer phase change memory technology of numonyx |
| author_facet |
Quiray, Josselsor Faustino |
| author_sort |
Quiray, Josselsor Faustino |
| title |
Electrical characterization and resolution of device failures on 90 nanometer phase change memory technology of numonyx |
| title_short |
Electrical characterization and resolution of device failures on 90 nanometer phase change memory technology of numonyx |
| title_full |
Electrical characterization and resolution of device failures on 90 nanometer phase change memory technology of numonyx |
| title_fullStr |
Electrical characterization and resolution of device failures on 90 nanometer phase change memory technology of numonyx |
| title_full_unstemmed |
Electrical characterization and resolution of device failures on 90 nanometer phase change memory technology of numonyx |
| title_sort |
electrical characterization and resolution of device failures on 90 nanometer phase change memory technology of numonyx |
| publisher |
Animo Repository |
| publishDate |
2010 |
| url |
https://animorepository.dlsu.edu.ph/etd_masteral/3896 |
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1794553688198479872 |