A development of burn-in self test capability for Intel flash memory devices

• 主要作者: Lim, Felix Chan
• 格式: text
• 語言: English
• 出版: Animo Repository 1994
• 主題: Integrated circuits; Magnetic memory (Calculating-machines) > Testing; Programmable array logic; Computer storage devices; x2 Memory devices; Engineering
• 在線閱讀: https://animorepository.dlsu.edu.ph/etd_masteral/1557
• 機構: De La Salle University

New generation of integrated circuits including Flash memories are getting more complex requiring a need for more stringent method of testing the functionality and reliability of these devices. The amount of test times involved and the accumulated through-put-time are gradually becoming a concern fo...