A development of burn-in self test capability for Intel flash memory devices

New generation of integrated circuits including Flash memories are getting more complex requiring a need for more stringent method of testing the functionality and reliability of these devices. The amount of test times involved and the accumulated through-put-time are gradually becoming a concern fo...

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Bibliographic Details
Main Author: Lim, Felix Chan
Format: text
Language:English
Published: Animo Repository 1994
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Online Access:https://animorepository.dlsu.edu.ph/etd_masteral/1557
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Institution: De La Salle University
Language: English

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