First principles based investigations of materials for resistive RAM
We investigate the suitable materials and device structures for Resistive Random Access Memory (ReRAM) based on the first principles calculations. Our calculations base on the model in which the transition metal oxide layers consist of three atomic layers. From the results of energy gap and magnetic...
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oai:animorepository.dlsu.edu.ph:faculty_research-50922022-05-11T04:03:24Z First principles based investigations of materials for resistive RAM Kishi, Hirofumi Kishi, Tomoya Diño, Wilson Agerico Minamitani, Emi Akinaga, Hiro Nakanishi, Hiroshi Kasai, Hideaki We investigate the suitable materials and device structures for Resistive Random Access Memory (ReRAM) based on the first principles calculations. Our calculations base on the model in which the transition metal oxide layers consist of three atomic layers. From the results of energy gap and magnetic moment of the transition metals, we can expect that CoO/NiO/CoO for the transition metal oxide layer exhibits high-resistance change and high-speed response. Copyright © 2008 American Scientific Publishers. All rights reserved. 2008-01-01T08:00:00Z text https://animorepository.dlsu.edu.ph/faculty_research/4233 info:doi/10.1166/jctn.2008.1003 Faculty Research Work Animo Repository Nonvolatile random-access memory Transition metal oxides Physics |
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Nonvolatile random-access memory Transition metal oxides Physics Kishi, Hirofumi Kishi, Tomoya Diño, Wilson Agerico Minamitani, Emi Akinaga, Hiro Nakanishi, Hiroshi Kasai, Hideaki First principles based investigations of materials for resistive RAM |
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We investigate the suitable materials and device structures for Resistive Random Access Memory (ReRAM) based on the first principles calculations. Our calculations base on the model in which the transition metal oxide layers consist of three atomic layers. From the results of energy gap and magnetic moment of the transition metals, we can expect that CoO/NiO/CoO for the transition metal oxide layer exhibits high-resistance change and high-speed response. Copyright © 2008 American Scientific Publishers. All rights reserved. |
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Kishi, Hirofumi Kishi, Tomoya Diño, Wilson Agerico Minamitani, Emi Akinaga, Hiro Nakanishi, Hiroshi Kasai, Hideaki |
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Kishi, Hirofumi Kishi, Tomoya Diño, Wilson Agerico Minamitani, Emi Akinaga, Hiro Nakanishi, Hiroshi Kasai, Hideaki |
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Kishi, Hirofumi |
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First principles based investigations of materials for resistive RAM |
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First principles based investigations of materials for resistive RAM |
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First principles based investigations of materials for resistive RAM |
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First principles based investigations of materials for resistive RAM |
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First principles based investigations of materials for resistive RAM |
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first principles based investigations of materials for resistive ram |
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2008 |
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