Reactive ion etching of transition-metal alloys

For production of advanced spin-electronic devices, such as a magnetic random access memory with the higher-density memory cell, a reactive ion etching (RIE) process of transition metal alloys is the indispensable component of development, while no transition-metal compounds with the relatively high...

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Bibliographic Details
Main Authors: Akinaga, Hiro, Takano, Fumiyoshi, Matsumoto, Shigeno, Diño, Wilson A.
Format: text
Published: Animo Repository 2006
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Online Access:https://animorepository.dlsu.edu.ph/faculty_research/4563
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Institution: De La Salle University
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Summary:For production of advanced spin-electronic devices, such as a magnetic random access memory with the higher-density memory cell, a reactive ion etching (RIE) process of transition metal alloys is the indispensable component of development, while no transition-metal compounds with the relatively high vapor pressure have been founded so far. Here, we show the RIE process of a NiFe thin film by using CH4:O2:NH3 discharge. The RIE process was designed by ab initio calculations, and the present result is the first successful demonstration of the chemical effect in the RIE process for transition-metal alloys. The relative etching ratio of NiFe against Ti as the metal mask was decreased by substituting CH4 with CHF3.