Surface analysis of silicon (100) wafer after contact electrification using Kelvin force microscopy
Contact electrification was demonstrated on Si (100) wafer, and surface charge images at submicron scale were analysed using Kelvin force microscopy (KFM). Potential map images have shown carpet-like patterns on the (100) plane of Si wafer. Individual potential spikes that appeared on the surface ar...
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| Main Authors: | , |
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| Format: | text |
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Animo Repository
2017
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| Online Access: | https://animorepository.dlsu.edu.ph/faculty_research/11335 https://animorepository.dlsu.edu.ph/context/faculty_research/article/9144/viewcontent/MANILA_JOURNAL_OF_SCIENCE_Surface_Analysis_of_Silicon__100__Wafer_After_Contact_Electrification_Using_Kelvin_Force_Microscopy.pdf |
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| Institution: | De La Salle University |