Negative-bias temperature instability – insight from recent dynamic stress experiments

• Main Authors: Ang, Diing Shenp, Boo, A. A., Gao, Yuan
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/100204; http://hdl.handle.net/10220/10968
• Institution: Nanyang Technological University

The purpose of this paper is to summarize key experimental evidences on the important role of hole trapping on negative-bias temperature instability (NBTI). For a long time, the focus of this research topic had been on interface degradation driven by hydrogen transport and hole trapping was regarded...