Measurement of large discontinuities using single white light interferogram white light interferogram
White light interferometry is a widely used tool to extend the unambiguous measurement range of a monochromatic interferometer. In this work, we discuss Hilbert transformation analysis of a single white light interferogram acquired with a single-chip color CCD camera for step height measurement whic...
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Main Authors: | , , , , , |
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Other Authors: | |
Format: | Article |
Language: | English |
Published: |
2014
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/101363 http://hdl.handle.net/10220/24151 |
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Institution: | Nanyang Technological University |
Language: | English |