Measurement of large discontinuities using single white light interferogram white light interferogram

White light interferometry is a widely used tool to extend the unambiguous measurement range of a monochromatic interferometer. In this work, we discuss Hilbert transformation analysis of a single white light interferogram acquired with a single-chip color CCD camera for step height measurement whic...

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Main Authors: Upputuri, Paul Kumar, Gong, Li, Wang, Haifeng, Pramanik, Manojit, Nandigana, Krishna Mohan, Kothiyal, Mahendra Prasad
Other Authors: School of Chemical and Biomedical Engineering
Format: Article
Language:English
Published: 2014
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Online Access:https://hdl.handle.net/10356/101363
http://hdl.handle.net/10220/24151
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-1013632023-12-29T06:52:07Z Measurement of large discontinuities using single white light interferogram white light interferogram Upputuri, Paul Kumar Gong, Li Wang, Haifeng Pramanik, Manojit Nandigana, Krishna Mohan Kothiyal, Mahendra Prasad School of Chemical and Biomedical Engineering DRNTU::Science::Biological sciences::Biochemistry White light interferometry is a widely used tool to extend the unambiguous measurement range of a monochromatic interferometer. In this work, we discuss Hilbert transformation analysis of a single white light interferogram acquired with a single-chip color CCD camera for step height measurement which lies beyond the unambiguous range of the monochromatic interferometry. The color interferogram is decomposed and phase maps for red, green, and blue components are calculated independently using Hilbert transformation. This procedure makes the measurement faster, simpler, and cost-effective. The usefulness of the technique is demonstrated on micro-sample. Accepted version 2014-10-30T00:45:19Z 2019-12-06T20:37:13Z 2014-10-30T00:45:19Z 2019-12-06T20:37:13Z 2014 2014 Journal Article Upputuri, P. K., Gong, L., Wang, H., Pramanik, M., Nandigana, K. M., & Kothiyal, M. P. (2014). Measurement of large discontinuities using single white light interferogram. Optics express, 22(22), 27373-27380. 1094-4087 https://hdl.handle.net/10356/101363 http://hdl.handle.net/10220/24151 10.1364/OE.22.027373 182536 en Optics express © 2014 Optical Society of America. This is the author created version of a work that has been peer reviewed and accepted for publication by Optics Express, Optical Society of America. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [Article DOI: http://dx.doi.org/10.1364/OE.22.027373]. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Science::Biological sciences::Biochemistry
spellingShingle DRNTU::Science::Biological sciences::Biochemistry
Upputuri, Paul Kumar
Gong, Li
Wang, Haifeng
Pramanik, Manojit
Nandigana, Krishna Mohan
Kothiyal, Mahendra Prasad
Measurement of large discontinuities using single white light interferogram white light interferogram
description White light interferometry is a widely used tool to extend the unambiguous measurement range of a monochromatic interferometer. In this work, we discuss Hilbert transformation analysis of a single white light interferogram acquired with a single-chip color CCD camera for step height measurement which lies beyond the unambiguous range of the monochromatic interferometry. The color interferogram is decomposed and phase maps for red, green, and blue components are calculated independently using Hilbert transformation. This procedure makes the measurement faster, simpler, and cost-effective. The usefulness of the technique is demonstrated on micro-sample.
author2 School of Chemical and Biomedical Engineering
author_facet School of Chemical and Biomedical Engineering
Upputuri, Paul Kumar
Gong, Li
Wang, Haifeng
Pramanik, Manojit
Nandigana, Krishna Mohan
Kothiyal, Mahendra Prasad
format Article
author Upputuri, Paul Kumar
Gong, Li
Wang, Haifeng
Pramanik, Manojit
Nandigana, Krishna Mohan
Kothiyal, Mahendra Prasad
author_sort Upputuri, Paul Kumar
title Measurement of large discontinuities using single white light interferogram white light interferogram
title_short Measurement of large discontinuities using single white light interferogram white light interferogram
title_full Measurement of large discontinuities using single white light interferogram white light interferogram
title_fullStr Measurement of large discontinuities using single white light interferogram white light interferogram
title_full_unstemmed Measurement of large discontinuities using single white light interferogram white light interferogram
title_sort measurement of large discontinuities using single white light interferogram white light interferogram
publishDate 2014
url https://hdl.handle.net/10356/101363
http://hdl.handle.net/10220/24151
_version_ 1787136733506174976