White light single-shot interferometry with colour CCD camera for optical inspection of microsystems
White light interferometry is a well-established optical tool for surface metrology of reflective samples. In this work, we discuss a single-shot white light interferometer based on single-chip color CCD camera and Hilbert transformation. The approach makes the measurement dynamic, faster, easier...
Saved in:
Main Authors: | , , , |
---|---|
Other Authors: | |
Format: | Conference or Workshop Item |
Language: | English |
Published: |
2015
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/93716 http://hdl.handle.net/10220/38386 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |