White light single-shot interferometry with colour CCD camera for optical inspection of microsystems
White light interferometry is a well-established optical tool for surface metrology of reflective samples. In this work, we discuss a single-shot white light interferometer based on single-chip color CCD camera and Hilbert transformation. The approach makes the measurement dynamic, faster, easier...
Saved in:
Main Authors: | , , , |
---|---|
其他作者: | |
格式: | Conference or Workshop Item |
語言: | English |
出版: |
2015
|
主題: | |
在線閱讀: | https://hdl.handle.net/10356/93716 http://hdl.handle.net/10220/38386 |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
機構: | Nanyang Technological University |
語言: | English |
成為第一個發表評論!