White light single-shot interferometry with colour CCD camera for optical inspection of microsystems

White light interferometry is a well-established optical tool for surface metrology of reflective samples. In this work, we discuss a single-shot white light interferometer based on single-chip color CCD camera and Hilbert transformation. The approach makes the measurement dynamic, faster, easier...

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Main Authors: Upputuri, Paul Kumar, Pramanik, Manojit, Nandigana, Krishna Mohan, Prasad, Mahendra
其他作者: School of Chemical and Biomedical Engineering
格式: Conference or Workshop Item
語言:English
出版: 2015
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在線閱讀:https://hdl.handle.net/10356/93716
http://hdl.handle.net/10220/38386
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機構: Nanyang Technological University
語言: English