Self-organization of ripples on Ti irradiated with focused ion beam

30 keV focused Ga+ ions were used to raster the metallographically polished surface of commercially pure Ti (CP Ti) at various FIB incidence angles over a wide range of doses (1016–1018 ions/cm2) at room temperature. The sputtered surfaces were observed in situ using FIB imaging and later carefully...

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Main Authors: Qian, H. X., Zhou, Wei
Other Authors: School of Mechanical and Aerospace Engineering
Format: Article
Language:English
Published: 2013
Online Access:https://hdl.handle.net/10356/101435
http://hdl.handle.net/10220/11082
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-1014352020-03-07T13:22:19Z Self-organization of ripples on Ti irradiated with focused ion beam Qian, H. X. Zhou, Wei School of Mechanical and Aerospace Engineering 30 keV focused Ga+ ions were used to raster the metallographically polished surface of commercially pure Ti (CP Ti) at various FIB incidence angles over a wide range of doses (1016–1018 ions/cm2) at room temperature. The sputtered surfaces were observed in situ using FIB imaging and later carefully characterized ex situ under scanning electron microscope (SEM) and atomic force microscope (AFM). Ripples were observed on the irradiated surfaces even at the normal FIB incidence angle. The ripple evolution is analyzed as functions of surface diffusion, surface crystallographic orientation, ion dose and incidence angle. It is found that the ripple orientation was progressively influenced by the ion beam direction with incidence angle increasing and in some cases curved ripples or fragmented rods viewed from different angles occurred at high ion doses. The morphological evolution from the well-developed straight ripples to the curved ones is never observed. The formation of ripples is attributed to the competition between the formation of ripples due to anisotropic surface diffusion and the formation of incidence-angle dependent ripples determined by Bradley–Harper (BH) model. 2013-07-10T02:29:08Z 2019-12-06T20:38:42Z 2013-07-10T02:29:08Z 2019-12-06T20:38:42Z 2011 2011 Journal Article Qian, H. X. & Zhou, W. (2012). Self-organization of ripples on Ti irradiated with focused ion beam. Applied Surface Science, 258(6), 1924-1928. 0169-4332 https://hdl.handle.net/10356/101435 http://hdl.handle.net/10220/11082 10.1016/j.apsusc.2011.06.152 en Applied surface science © 2011 Elsevier B.V.
institution Nanyang Technological University
building NTU Library
country Singapore
collection DR-NTU
language English
description 30 keV focused Ga+ ions were used to raster the metallographically polished surface of commercially pure Ti (CP Ti) at various FIB incidence angles over a wide range of doses (1016–1018 ions/cm2) at room temperature. The sputtered surfaces were observed in situ using FIB imaging and later carefully characterized ex situ under scanning electron microscope (SEM) and atomic force microscope (AFM). Ripples were observed on the irradiated surfaces even at the normal FIB incidence angle. The ripple evolution is analyzed as functions of surface diffusion, surface crystallographic orientation, ion dose and incidence angle. It is found that the ripple orientation was progressively influenced by the ion beam direction with incidence angle increasing and in some cases curved ripples or fragmented rods viewed from different angles occurred at high ion doses. The morphological evolution from the well-developed straight ripples to the curved ones is never observed. The formation of ripples is attributed to the competition between the formation of ripples due to anisotropic surface diffusion and the formation of incidence-angle dependent ripples determined by Bradley–Harper (BH) model.
author2 School of Mechanical and Aerospace Engineering
author_facet School of Mechanical and Aerospace Engineering
Qian, H. X.
Zhou, Wei
format Article
author Qian, H. X.
Zhou, Wei
spellingShingle Qian, H. X.
Zhou, Wei
Self-organization of ripples on Ti irradiated with focused ion beam
author_sort Qian, H. X.
title Self-organization of ripples on Ti irradiated with focused ion beam
title_short Self-organization of ripples on Ti irradiated with focused ion beam
title_full Self-organization of ripples on Ti irradiated with focused ion beam
title_fullStr Self-organization of ripples on Ti irradiated with focused ion beam
title_full_unstemmed Self-organization of ripples on Ti irradiated with focused ion beam
title_sort self-organization of ripples on ti irradiated with focused ion beam
publishDate 2013
url https://hdl.handle.net/10356/101435
http://hdl.handle.net/10220/11082
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