Self-organization of ripples on Ti irradiated with focused ion beam

• Main Authors: Qian, H. X., Zhou, Wei
• Other Authors: School of Mechanical and Aerospace Engineering
• Format: Article
• Language: English
• Published: 2013
• Online Access: https://hdl.handle.net/10356/101435; http://hdl.handle.net/10220/11082
• Institution: Nanyang Technological University

30 keV focused Ga+ ions were used to raster the metallographically polished surface of commercially pure Ti (CP Ti) at various FIB incidence angles over a wide range of doses (1016–1018 ions/cm2) at room temperature. The sputtered surfaces were observed in situ using FIB imaging and later carefully...