Self-organization of ripples on Ti irradiated with focused ion beam
30 keV focused Ga+ ions were used to raster the metallographically polished surface of commercially pure Ti (CP Ti) at various FIB incidence angles over a wide range of doses (1016–1018 ions/cm2) at room temperature. The sputtered surfaces were observed in situ using FIB imaging and later carefully...
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| Main Authors: | , |
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| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
2013
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| Online Access: | https://hdl.handle.net/10356/101435 http://hdl.handle.net/10220/11082 |
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| Institution: | Nanyang Technological University |
| Language: | English |