Effects of electrode material and configuration on the characteristics of planar resistive switching devices

We report that electrode engineering, particularly tailoring the metal work function, measurement configuration and geometric shape, has significant effects on the bipolar resistive switching (RS) in lateral memory devices based on self-doped SrTiO3 (STO) single crystals. Metals with different work...

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Main Authors: Cha, Dongkyu, David, A., Li, K., Wu, T., Peng, H. Y., Pu, L., Wu, J. C., Hong, J. H., Lin, W. N., Li, Y. Y., Ding, J. F.
Other Authors: School of Physical and Mathematical Sciences
Format: Article
Language:English
Published: 2014
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Online Access:https://hdl.handle.net/10356/101706
http://hdl.handle.net/10220/19732
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-1017062023-02-28T19:42:16Z Effects of electrode material and configuration on the characteristics of planar resistive switching devices Cha, Dongkyu David, A. Li, K. Wu, T. Peng, H. Y. Pu, L. Wu, J. C. Hong, J. H. Lin, W. N. Li, Y. Y. Ding, J. F. School of Physical and Mathematical Sciences DRNTU::Engineering::Materials We report that electrode engineering, particularly tailoring the metal work function, measurement configuration and geometric shape, has significant effects on the bipolar resistive switching (RS) in lateral memory devices based on self-doped SrTiO3 (STO) single crystals. Metals with different work functions (Ti and Pt) and their combinations are used to control the junction transport (either ohmic or Schottky-like). We find that the electric bias is effective in manipulating the concentration of oxygen vacancies at the metal/STO interface, influencing the RS characteristics. Furthermore, we show that the geometric shapes of electrodes (e.g., rectangular, circular, or triangular) affect the electric field distribution at the metal/oxide interface, thus plays an important role in RS. These systematic results suggest that electrode engineering should be deemed as a powerful approach toward controlling and improving the characteristics of RS memories. Published version 2014-06-13T02:50:23Z 2019-12-06T20:43:06Z 2014-06-13T02:50:23Z 2019-12-06T20:43:06Z 2013 2013 Journal Article Peng, H. Y., Pu, L., Wu, J. C., Cha, D., Hong, J. H., Lin, W. N., et al. (2013). Effects of electrode material and configuration on the characteristics of planar resistive switching devices. APL Materials, 1(5), 052106-. 2166-532X https://hdl.handle.net/10356/101706 http://hdl.handle.net/10220/19732 10.1063/1.4827597 en APL materials © 2013 The Author(s). This paper was published in APL Materials and is made available as an electronic reprint (preprint) with permission of the Author(s). The paper can be found at the following official DOI: http://dx.doi.org/10.1063/1.4827597.  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Materials
spellingShingle DRNTU::Engineering::Materials
Cha, Dongkyu
David, A.
Li, K.
Wu, T.
Peng, H. Y.
Pu, L.
Wu, J. C.
Hong, J. H.
Lin, W. N.
Li, Y. Y.
Ding, J. F.
Effects of electrode material and configuration on the characteristics of planar resistive switching devices
description We report that electrode engineering, particularly tailoring the metal work function, measurement configuration and geometric shape, has significant effects on the bipolar resistive switching (RS) in lateral memory devices based on self-doped SrTiO3 (STO) single crystals. Metals with different work functions (Ti and Pt) and their combinations are used to control the junction transport (either ohmic or Schottky-like). We find that the electric bias is effective in manipulating the concentration of oxygen vacancies at the metal/STO interface, influencing the RS characteristics. Furthermore, we show that the geometric shapes of electrodes (e.g., rectangular, circular, or triangular) affect the electric field distribution at the metal/oxide interface, thus plays an important role in RS. These systematic results suggest that electrode engineering should be deemed as a powerful approach toward controlling and improving the characteristics of RS memories.
author2 School of Physical and Mathematical Sciences
author_facet School of Physical and Mathematical Sciences
Cha, Dongkyu
David, A.
Li, K.
Wu, T.
Peng, H. Y.
Pu, L.
Wu, J. C.
Hong, J. H.
Lin, W. N.
Li, Y. Y.
Ding, J. F.
format Article
author Cha, Dongkyu
David, A.
Li, K.
Wu, T.
Peng, H. Y.
Pu, L.
Wu, J. C.
Hong, J. H.
Lin, W. N.
Li, Y. Y.
Ding, J. F.
author_sort Cha, Dongkyu
title Effects of electrode material and configuration on the characteristics of planar resistive switching devices
title_short Effects of electrode material and configuration on the characteristics of planar resistive switching devices
title_full Effects of electrode material and configuration on the characteristics of planar resistive switching devices
title_fullStr Effects of electrode material and configuration on the characteristics of planar resistive switching devices
title_full_unstemmed Effects of electrode material and configuration on the characteristics of planar resistive switching devices
title_sort effects of electrode material and configuration on the characteristics of planar resistive switching devices
publishDate 2014
url https://hdl.handle.net/10356/101706
http://hdl.handle.net/10220/19732
_version_ 1759857676214337536