A new approach to the design of efficient residue generators for arbitrary moduli

A new approach to the design of efficient residue generators for arbitrary moduli

Recent analyses demonstrate that operations in some bases of Residue Number System (RNS) exhibit higher resiliency to process variations than in normal binary number system. Under this premise, arbitrary moduli offer greater flexibility in forming high cardinality balanced RNS with variation-insensi...

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書目詳細資料
Main Authors:	Low, Jeremy Yung Shern, Chang, Chip Hong
其他作者:	School of Electrical and Electronic Engineering
格式:	Article
語言:	English
出版:	2013
主題:	DRNTU::Engineering::Electrical and electronic engineering
在線閱讀:	https://hdl.handle.net/10356/101891 http://hdl.handle.net/10220/16797
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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