Reliability study of LED driver – a case study of black box testing

• Main Authors: Lan, Song, Tan, Cher Ming, Wu, Kevin
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/102371; http://hdl.handle.net/10220/11192
• Institution: Nanyang Technological University

A method to evaluate the reliability of the Integrated Circuit without knowing the details of the internal circuit is developed. This method is called Pseudo Black Box testing because the basic knowledge of circuit theory is needed. In this paper, this black box testing is applied to the reliability...