Reliability study of LED driver – a case study of black box testing

A method to evaluate the reliability of the Integrated Circuit without knowing the details of the internal circuit is developed. This method is called Pseudo Black Box testing because the basic knowledge of circuit theory is needed. In this paper, this black box testing is applied to the reliability...

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Main Authors:	Lan, Song, Tan, Cher Ming, Wu, Kevin
Other Authors:	School of Electrical and Electronic Engineering
Format:	Article
Language:	English
Published:	2013
Subjects:	DRNTU::Engineering::Electrical and electronic engineering
Online Access:	https://hdl.handle.net/10356/102371 http://hdl.handle.net/10220/11192
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Institution:	Nanyang Technological University
Language:	English

id	sg-ntu-dr.10356-102371
record_format	dspace
spelling	sg-ntu-dr.10356-1023712020-03-07T14:00:33Z Reliability study of LED driver – a case study of black box testing Lan, Song Tan, Cher Ming Wu, Kevin School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering A method to evaluate the reliability of the Integrated Circuit without knowing the details of the internal circuit is developed. This method is called Pseudo Black Box testing because the basic knowledge of circuit theory is needed. In this paper, this black box testing is applied to the reliability study of a commercial LED driver and the circuit degradation model is built. The possible failure mechanisms of the LED driver are proposed and verified through failure analysis. 2013-07-11T04:14:13Z 2019-12-06T20:54:01Z 2013-07-11T04:14:13Z 2019-12-06T20:54:01Z 2012 2012 Journal Article Lan, S., Tan, C. M., Wu, K. (2012). Reliability study of LED driver – a case study of black box testing. Microelectronics Reliability, 52(9-10), 1940-1944. https://hdl.handle.net/10356/102371 http://hdl.handle.net/10220/11192 10.1016/j.microrel.2012.06.023 en Microelectronics reliability © 2012 Elsevier Ltd.
institution	Nanyang Technological University
building	NTU Library
country	Singapore
collection	DR-NTU
language	English
topic	DRNTU::Engineering::Electrical and electronic engineering
spellingShingle	DRNTU::Engineering::Electrical and electronic engineering Lan, Song Tan, Cher Ming Wu, Kevin Reliability study of LED driver – a case study of black box testing
description	A method to evaluate the reliability of the Integrated Circuit without knowing the details of the internal circuit is developed. This method is called Pseudo Black Box testing because the basic knowledge of circuit theory is needed. In this paper, this black box testing is applied to the reliability study of a commercial LED driver and the circuit degradation model is built. The possible failure mechanisms of the LED driver are proposed and verified through failure analysis.
author2	School of Electrical and Electronic Engineering
author_facet	School of Electrical and Electronic Engineering Lan, Song Tan, Cher Ming Wu, Kevin
format	Article
author	Lan, Song Tan, Cher Ming Wu, Kevin
author_sort	Lan, Song
title	Reliability study of LED driver – a case study of black box testing
title_short	Reliability study of LED driver – a case study of black box testing
title_full	Reliability study of LED driver – a case study of black box testing
title_fullStr	Reliability study of LED driver – a case study of black box testing
title_full_unstemmed	Reliability study of LED driver – a case study of black box testing
title_sort	reliability study of led driver – a case study of black box testing
publishDate	2013
url	https://hdl.handle.net/10356/102371 http://hdl.handle.net/10220/11192
_version_	1681046379331321856

Reliability study of LED driver – a case study of black box testing

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