Electron paramagnetic resonance tagged high-resolution excitation spectroscopy of NV-centers in 4H-SiC
We show that electron paramagnetic resonance (EPR) tagged high resolution photoexcitation spectroscopy is a powerful method for the correlation of zero phonon photoluminescence spectra with atomic point defects. Applied to the case of NV centers in 4H-SiC it allows to associate the photoluminescence...
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Main Authors: | , , , , , , |
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Other Authors: | |
Format: | Article |
Language: | English |
Published: |
2019
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/102648 http://hdl.handle.net/10220/47783 |
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Institution: | Nanyang Technological University |
Language: | English |