Electron paramagnetic resonance tagged high-resolution excitation spectroscopy of NV-centers in 4H-SiC

We show that electron paramagnetic resonance (EPR) tagged high resolution photoexcitation spectroscopy is a powerful method for the correlation of zero phonon photoluminescence spectra with atomic point defects. Applied to the case of NV centers in 4H-SiC it allows to associate the photoluminescence...

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Main Authors: Zargaleh, Soroush Abbasi, von Bardeleben, H. J., Cantin, J. L., Gerstmann, U., Hameau, S., Eblé, B., Gao, Weibo
其他作者: School of Physical and Mathematical Sciences
格式: Article
語言:English
出版: 2019
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在線閱讀:https://hdl.handle.net/10356/102648
http://hdl.handle.net/10220/47783
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機構: Nanyang Technological University
語言: English

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