Electron paramagnetic resonance tagged high-resolution excitation spectroscopy of NV-centers in 4H-SiC
We show that electron paramagnetic resonance (EPR) tagged high resolution photoexcitation spectroscopy is a powerful method for the correlation of zero phonon photoluminescence spectra with atomic point defects. Applied to the case of NV centers in 4H-SiC it allows to associate the photoluminescence...
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Main Authors: | Zargaleh, Soroush Abbasi, von Bardeleben, H. J., Cantin, J. L., Gerstmann, U., Hameau, S., Eblé, B., Gao, Weibo |
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其他作者: | School of Physical and Mathematical Sciences |
格式: | Article |
語言: | English |
出版: |
2019
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主題: | |
在線閱讀: | https://hdl.handle.net/10356/102648 http://hdl.handle.net/10220/47783 |
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機構: | Nanyang Technological University |
語言: | English |
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