A 0.4V 7T SRAM with write through virtual ground and ultra-fine grain power gating switches

This paper presents a 7T near-threshold SRAM with design techniques for improving cell stability and energy efficiency. The proposed write through virtual ground (WTVG) scheme decreases the period of write disturbance by 6.1×. A PVT tracking sensing scheme is presented to track variation and sense s...

وصف كامل

محفوظ في:
التفاصيل البيبلوغرافية
المؤلفون الرئيسيون: Kim, Tony Tae-Hyoung, Yeoh, Yuan Lin, Wang, Bo, Yu, Xiangyao
مؤلفون آخرون: School of Electrical and Electronic Engineering
التنسيق: Conference or Workshop Item
اللغة:English
منشور في: 2013
الموضوعات:
الوصول للمادة أونلاين:https://hdl.handle.net/10356/105330
http://hdl.handle.net/10220/16579
http://dx.doi.org/10.1109/ISCAS.2013.6572517
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المؤسسة: Nanyang Technological University
اللغة: English
الوصف
الملخص:This paper presents a 7T near-threshold SRAM with design techniques for improving cell stability and energy efficiency. The proposed write through virtual ground (WTVG) scheme decreases the period of write disturbance by 6.1×. A PVT tracking sensing scheme is presented to track variation and sense small RBL swing. The ultra-fine grain power gating switches are implemented to minimize the redundant leakage caused by the storage of garbage data. The leakage suppression of 52% is achieved after the initial power-up. A 16 kb SRAM test chip was fabricated in a 65nm CMOS technology and showed the minimum energy of 2.01 pJ at 0.4 V.