A 0.4V 7T SRAM with write through virtual ground and ultra-fine grain power gating switches
This paper presents a 7T near-threshold SRAM with design techniques for improving cell stability and energy efficiency. The proposed write through virtual ground (WTVG) scheme decreases the period of write disturbance by 6.1×. A PVT tracking sensing scheme is presented to track variation and sense s...
محفوظ في:
المؤلفون الرئيسيون: | , , , |
---|---|
مؤلفون آخرون: | |
التنسيق: | Conference or Workshop Item |
اللغة: | English |
منشور في: |
2013
|
الموضوعات: | |
الوصول للمادة أونلاين: | https://hdl.handle.net/10356/105330 http://hdl.handle.net/10220/16579 http://dx.doi.org/10.1109/ISCAS.2013.6572517 |
الوسوم: |
إضافة وسم
لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!
|
المؤسسة: | Nanyang Technological University |
اللغة: | English |
الملخص: | This paper presents a 7T near-threshold SRAM with design techniques for improving cell stability and energy efficiency. The proposed write through virtual ground (WTVG) scheme decreases the period of write disturbance by 6.1×. A PVT tracking sensing scheme is presented to track variation and sense small RBL swing. The ultra-fine grain power gating switches are implemented to minimize the redundant leakage caused by the storage of garbage data. The leakage suppression of 52% is achieved after the initial power-up. A 16 kb SRAM test chip was fabricated in a 65nm CMOS technology and showed the minimum energy of 2.01 pJ at 0.4 V. |
---|