“Multipoint force feedback” leveling of massively parallel tip arrays in scanning probe lithography
Nanoscale patterning with massively parallel 2D array tips is of significant interest in scanning probe lithography. A challenging task for tip-based large area nanolithography is maintaining parallel tip arrays at the same contact point with a sample substrate in order to pattern a uniform array. H...
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Main Authors: | , , , , , , , |
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格式: | Article |
語言: | English |
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2015
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在線閱讀: | https://hdl.handle.net/10356/106024 http://hdl.handle.net/10220/26285 |
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機構: | Nanyang Technological University |
語言: | English |