Breaking diffraction limit of far-field imaging via structured illumination bessel beam microscope (SIBM)

• Main Authors: Perinchery, Sandeep Menon, Haridas, Aswin, Shinde, Anant, Buchnev, Oleksandr, Murukeshan, Vadakke Matham
• Other Authors: School of Mechanical and Aerospace Engineering
• Format: Article
• Language: English
• Published: 2019
• Subjects: Microscopy; Engineering::Mechanical engineering; Imaging Systems
• Online Access: https://hdl.handle.net/10356/106408; http://hdl.handle.net/10220/49624
• Institution: Nanyang Technological University

Breaking the diffraction limit in imaging microscopes with far-field imaging options has always been the thrust challenge for optical engineers and biologists over the years. Although structured illumination microscopy and Bessel beam assisted imaging has shown the capability of imaging with sub-diffraction resolutions, they rely on the use of objective lenses with large numerical apertures (NA). Hence, they fail to sustain resolutions at larger working distances. In this context, we demonstrate a method for nanoscale resolution imaging at longer working distances, named as Structured Illumination Bessel Microscopy (SIBM). The proposed method is envisaged for both biological and engineering applications that necessitate high imaging resolutions at large working distances.