Microscopy using randomized speckle illumination

It is well known for structured illumination microscopy (SIM) that the lateral resolution by a factor of two beyond the classical diffraction limit is achieved using spatially structured illumination in wide-field fluorescence microscope. In the state of art SIM systems, grating patterns are general...

Full description

Saved in:
Bibliographic Details
Main Authors: Perinchery, Sandeep Menon, Shinde, Anant, Murukeshan, Vadakke Matham
Other Authors: Asundi, Anand K.
Format: Article
Language:English
Published: 2019
Subjects:
Online Access:https://hdl.handle.net/10356/106440
http://hdl.handle.net/10220/49637
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
Language: English
id sg-ntu-dr.10356-106440
record_format dspace
spelling sg-ntu-dr.10356-1064402023-03-04T17:22:39Z Microscopy using randomized speckle illumination Perinchery, Sandeep Menon Shinde, Anant Murukeshan, Vadakke Matham Asundi, Anand K. School of Mechanical and Aerospace Engineering Fifth International Conference on Optical and Photonics Engineering Center for Optical and Laser Engineering Structure Illumination Speckle Engineering::Mechanical engineering It is well known for structured illumination microscopy (SIM) that the lateral resolution by a factor of two beyond the classical diffraction limit is achieved using spatially structured illumination in wide-field fluorescence microscope. In the state of art SIM systems, grating patterns are generally generated by physical gratings or by spatial light modulators such as digital micro mirrors (DMD), liquid crystal displays (LCD). In this study, using a combination of LCD and ground glasses, size controlled randomized speckle patterns are generated as an illumination source for the microscope. Proof of concept of using speckle illumination in SIM configuration is tested by imaging fixed BPAE cells. MOE (Min. of Education, S’pore) Published version 2019-08-14T09:09:27Z 2019-12-06T22:11:48Z 2019-08-14T09:09:27Z 2019-12-06T22:11:48Z 2017 Journal Article Perinchery, S. M., Shinde, A., & Vadakke Matham, M. (2017). Microscopy using randomized speckle illumination. Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering, 10449, 104490H-. doi:10.1117/12.2269564 0277-786X https://hdl.handle.net/10356/106440 http://hdl.handle.net/10220/49637 10.1117/12.2269564 en Proceedings of SPIE - International Conference on Optical and Photonics Engineering © 2017 SPIE. All rights reserved. This paper was published in Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering and is made available with permission of SPIE. 5 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic Structure Illumination
Speckle
Engineering::Mechanical engineering
spellingShingle Structure Illumination
Speckle
Engineering::Mechanical engineering
Perinchery, Sandeep Menon
Shinde, Anant
Murukeshan, Vadakke Matham
Microscopy using randomized speckle illumination
description It is well known for structured illumination microscopy (SIM) that the lateral resolution by a factor of two beyond the classical diffraction limit is achieved using spatially structured illumination in wide-field fluorescence microscope. In the state of art SIM systems, grating patterns are generally generated by physical gratings or by spatial light modulators such as digital micro mirrors (DMD), liquid crystal displays (LCD). In this study, using a combination of LCD and ground glasses, size controlled randomized speckle patterns are generated as an illumination source for the microscope. Proof of concept of using speckle illumination in SIM configuration is tested by imaging fixed BPAE cells.
author2 Asundi, Anand K.
author_facet Asundi, Anand K.
Perinchery, Sandeep Menon
Shinde, Anant
Murukeshan, Vadakke Matham
format Article
author Perinchery, Sandeep Menon
Shinde, Anant
Murukeshan, Vadakke Matham
author_sort Perinchery, Sandeep Menon
title Microscopy using randomized speckle illumination
title_short Microscopy using randomized speckle illumination
title_full Microscopy using randomized speckle illumination
title_fullStr Microscopy using randomized speckle illumination
title_full_unstemmed Microscopy using randomized speckle illumination
title_sort microscopy using randomized speckle illumination
publishDate 2019
url https://hdl.handle.net/10356/106440
http://hdl.handle.net/10220/49637
_version_ 1759852958205345792